ViconInfrared Lock-In Thermography
Carrier Lifetime Mapping
Carrier Lifetime Imaging for Solar Cells
A comparison of transient and imaging techniques for measuring Minority-carrier Lifetime
G.M Berman1,2 S.W.Johnson1 N.J. Call3 R.K Ahrenkiel1,2 and R.A Rotolante4
1National Renewable Energy Laboratory, Golden, CO 80401 2Optical Science & Engineering Program, University of Colorado, Boulder, CO 80304 3Colorado School of Mines, Golden, CO 80401 4Vicon Infrared, Acton, MA 01720
*Presented at 18th Silicon Solar Cell Workshop, Vail, CO, August, 2008
G.M Berman1,2 S.W.Johnson1 N.J. Call3 R.K Ahrenkiel1,2 and R.A Rotolante4
1National Renewable Energy Laboratory, Golden, CO 80401 2Optical Science & Engineering Program, University of Colorado, Boulder, CO 80304 3Colorado School of Mines, Golden, CO 80401 4Vicon Infrared, Acton, MA 01720
*Presented at 18th Silicon Solar Cell Workshop, Vail, CO, August, 2008
Fourier Amplitude Image showing change in 3-5 um transmission of wafer with 810 nm laser excitation.
Wafer purposely contaminated with iron spots.
Images such as this are acquired in seconds.
Lifetime calibrated in usec.
Wafer purposely contaminated with iron spots.
Images such as this are acquired in seconds.
Lifetime calibrated in usec.
